The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Jan. 15, 2014
Applicant:

Stmicroelectronics S.r.l., Agrate Brianza, IT;

Inventors:

Danilo Pietro Pau, Sesto San Giovanni, IT;

Arcangelo Ranieri Bruna, Giardini Naxos, IT;

Ettore Napoli, Baronissi, IT;

Giorgio Lopez, Naples, IT;

Assignee:

STMicroelectronics S.R.L., Agrate Brianza, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06T 3/40 (2006.01); G06K 9/52 (2006.01); G06F 17/30 (2006.01); G06K 9/46 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4092 (2013.01); G06F 17/30247 (2013.01); G06K 9/527 (2013.01); G06T 3/4084 (2013.01); G06K 9/00986 (2013.01); G06K 9/4671 (2013.01);
Abstract

An embodiment of a method for computing pyramids of input images (I) in a transformed domain, e.g., for search and retrieval purposes, includes:—arranging input images in blocks to produce input image blocks,—subjecting the input image blocks to block processing including: transform into a transformed domain, subjecting the image blocks transformed into a transformed domain to filtering, subjecting the image blocks transformed into a transformed domain and filtered to inverse transform implementing an inverse transform with respect to the previous transform into a transformed domain, thus producing a set of processed blocks. The set of processed blocks, which is recomposeable to an image pyramid, may be used, e.g., in detecting extrema points in images in the pyramid, extracting a patch of given size around the extrema points detected, and processing the patch to obtain local descriptors such as SIFT descriptors of a feature.


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