The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Mar. 23, 2015
Applicant:

Certusview Technologies, Llc, Palm Beach Gardens, FL (US);

Inventors:

Steven Nielsen, North Palm Beach, FL (US);

Curtis Chambers, Palm Beach Gardens, FL (US);

Jeffrey Farr, Royal Palm Beach, FL (US);

David Pennington, Huntsville, AL (US);

Assignee:

CertusView Technologies, LLC, Palm Beach Gardens, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06395 (2013.01); G06Q 10/0639 (2013.01);
Abstract

Methods and apparatus to evaluate a quality of a locate and/or marking operation performed at a work site of proposed excavation in response to a locate request ticket. A display device displays a first portion of a graphical user interface based on first information from the locate request ticket, and further displays a second portion of the graphical user interface based on second information relating to the locate and/or marking operation as performed at the work site by a field technician. One or more indications of a quality assessment of the locate and/or marking operation are generated based on a comparison of at least some of the first information and at least some of the second information, and an electronic record of the quality assessment is stored and/or transmitted based on the indication(s).


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