The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Sep. 25, 2013
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06N 7/02 (2006.01); G06N 7/06 (2006.01); G06N 5/04 (2006.01); G06N 7/04 (2006.01); G06N 7/00 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06N 5/048 (2013.01); G06N 5/04 (2013.01); G06N 7/005 (2013.01); G06N 7/04 (2013.01); G06N 99/005 (2013.01);
Abstract
Latent Dirichlet allocation (LDA) analysis on a dataset is performed on an MPP relational database by distributing subsets of said dataset to a plurality of segments of the MPP database, and performing LDA analysis in parallel on the respective subsets on the plurality of segments using Gibbs sampling. An object library on each segment provides executable objects of user defined functions that can be called by an SQL query when the query requires functionality provided by an object.