The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Nov. 29, 2012
International Business Machines Corporation, Armonk, NY (US);
Tsuyoshi Ide, Kanagawa, JP;
Raymond H. Rudy, Tokyo, JP;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Provided are a method, an apparatus and a computer program for calculating a risk assessment value for an event sequence, which are capable of calculating the risk assessment value of each even sequence by calculating a totally ordered set on the basis of a partially ordered set indicating the event sequence. The risk assessment value of an event sequence that is a partially ordered set indicating some events of an event group of M kinds of events (M is a finite natural number) in a time series. The partially ordered set is converted into an approximate totally ordered set, and an M-dimensional feature vector is calculated based on the totally ordered set obtained by the conversion. A projection matrix for calculating the risk assessment value is calculated using the calculated M-dimensional feature vector.