The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Mar. 14, 2013
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Zhuowen Tu, Beijing, CN;

Yan Xu, Beijing, CN;

Junyan Zhu, Pittsburgh, PA (US);

Eric I-Chao Chang, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6259 (2013.01); G06T 7/0081 (2013.01); G06T 7/0087 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20141 (2013.01);
Abstract

The techniques and systems described herein create and train a multiple clustered instance learning (MCIL) model based on image features and patterns extracted from training images. The techniques and systems separate each of the training images into a plurality of instances (or patches), and then learn multiple instance-level classifiers based on the extracted image features. The instance-level classifiers are then integrated into the MCIL model so that the MCIL model, when applied to unclassified images, can perform image-level classification, patch-level clustering, and pixel-level segmentation.


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