The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Apr. 25, 2012
Shunsuke Ariyoshi, Kobe, JP;
Shunsuke Yao, Kobe, JP;
Shunsuke Ariyoshi, Kobe, JP;
Shunsuke Yao, Kobe, JP;
SYSMEX CORPORATION, Hyogo, JP;
Abstract
A data management computer for a sample measuring apparatus is disclosed. The computer comprises a data storage, a display section; an input device; and a controller. The data storage stores results of measurements for a sample obtained by the sample measuring apparatus, the measurements including an initial measurement for a sample and a secondary measurement which is performed on the sample following the initial measurement. The controller is programmed to cause the display section to display a first result screen which shows a result of the initial measurement for a sample, receive a predefined operation by use of the input device while displaying the first result screen, and cause the display section to display, in a response to the predefined operation, a second result screen which shows a result of the secondary measurement for the sample.