The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Nov. 11, 2010
Jiuliu LU, Homestead, FL (US);
Zihua Wang, Newton, MA (US);
Antonio Arevalo Reyes, Middleton, MA (US);
Erik Alan Gustafson, Norwood, MA (US);
John Steven Riley, Miami, FL (US);
Jiuliu Lu, Homestead, FL (US);
Zihua Wang, Newton, MA (US);
Antonio Arevalo Reyes, Middleton, MA (US);
Erik Alan Gustafson, Norwood, MA (US);
John Steven Riley, Miami, FL (US);
Beckman Coulter, Inc., Brea, CA (US);
Abstract
Systems and methods for identifying Methicillin resistant strains of(MRSA) in a sample are used that are based on the fact that an MRSA positive sample should have roughly the same copy numbers of mecA, SCCmec, and a-specific target gene sequence. The systems and methods may further present the three assays simultaneously on a 2-D plot with each axis of the plot 120 degrees apart. According to one embodiment, a Y plot is used for the 2-D display. If a given sample has similar readings of mecA, SCCmec, and a-specific target gene sequence, the sample's measured copy numbers of mecA, SCCmec, and the-specific target gene sequence can plot close to the origin regardless of the sample's absolute assay readings. With the help of this transformation, a boundary function can be defined that can be used to distinguish MRSA-positive samples from MRSA-negative samples.