The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Jul. 22, 2011
Applicants:

James Ausdenmoore, Gurnee, IL (US);

Peter Osella, Chicago, IL (US);

Ralph Taylor, Hawthorne Woods, IL (US);

Inventors:

James Ausdenmoore, Gurnee, IL (US);

Peter Osella, Chicago, IL (US);

Ralph Taylor, Hawthorne Woods, IL (US);

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G06F 19/20 (2011.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G06F 19/20 (2013.01); G01N 35/00623 (2013.01);
Abstract

An analyzer includes a display, measurement hardware configured to perform a measurement on a sample, and a controller. The controller is in communication with the display and the measurement hardware and is configured to communicate, via the display, a first pre-analytical procedure of the sample prior to measurement of the sample. The controller is also configured to maintain the analyzer in a state associated with the first procedure for an amount of time equal to a time needed for performing the first procedure. After the time needed for performing the first procedure has elapsed, the controller is configured to communicate, via the display, a second pre-analytical procedure of the sample prior to measurement of the sample.


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