The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Oct. 01, 2008
Applicants:

David L. Marvit, San Francisco, CA (US);

Jawahar Jain, Los Altos, CA (US);

Stergios Stergiou, Sunnyvale, CA (US);

Alex Gilman, Fremont, CA (US);

B. Thomas Adler, Santa Cruz, CA (US);

John J. Sidorowich, Santa Cruz, CA (US);

Yannis Labrou, Washington, DC (US);

Inventors:

David L. Marvit, San Francisco, CA (US);

Jawahar Jain, Los Altos, CA (US);

Stergios Stergiou, Sunnyvale, CA (US);

Alex Gilman, Fremont, CA (US);

B. Thomas Adler, Santa Cruz, CA (US);

John J. Sidorowich, Santa Cruz, CA (US);

Yannis Labrou, Washington, DC (US);

Assignee:

Fujitsu Limited, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3071 (2013.01); G06F 17/30616 (2013.01);
Abstract

In one embodiment, modeling topics includes accessing a corpus comprising documents that include words. Words of a document are selected as keywords of the document. The documents are clustered according to the keywords to yield clusters, where each cluster corresponds to a topic. A statistical distribution is generated for a cluster from words of the documents of the cluster. A topic is modeled using the statistical distribution generated for the cluster corresponding to the topic.


Find Patent Forward Citations

Loading…