The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Sep. 26, 2012
Applicants:

Yanhua LI, Minneapolis, MN (US);

Moritz M. Steiner, Montclair, NJ (US);

Inventors:

Yanhua Li, Minneapolis, MN (US);

Moritz M. Steiner, Montclair, NJ (US);

Assignee:

Alcatel Lucent, Boulogne-Billancourt, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30241 (2013.01);
Abstract

Various embodiments provide a method and apparatus for obtaining a representative sample set of venues (i.e., places) within a geographic region in a location based network using a low cost and efficient sampling and estimating algorithm. In particular, a dynamic random region sampling algorithm randomly selects a target location within a geographic region and then determines a sub-region containing the target location within the geographic region based on venue density prediction. Venue density prediction is based on a weighted average of venue densities of two or more comparable locations within the geographic region.


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