The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Dec. 28, 2013
Applicant:

Panaya Ltd., Raanana, IL;

Inventors:

Yossi Cohen, Raanana, IL;

Mati Cohen, Raanana, IL;

Nurit Dor, Raanana, IL;

Dror Weiss, Raanana, IL;

Assignee:

Panaya Ltd., Raanana, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01);
Abstract

Utilizing data collected from users belonging to different organizations to select a test scenario template relevant for testing configuration elements involves the following: identifying runs of test scenarios run by users belonging to different organizations; clustering the runs of test scenarios to clusters that include similar runs; generating connections between the configuration elements and the clusters; weighting the connections based on the number of users that acted according to the connections; receiving certain configuration elements; selecting a certain cluster based on a subset of the certain configuration elements and the connections, where each element in the subset is connected to the certain cluster by a connection, and the sum of weights of connections between elements in the subset and the certain cluster, reaches a threshold; and selecting a test scenario template representing the certain cluster.


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