The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Oct. 15, 2013
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Omar Cardona, Cedar Park, TX (US);

Baltazar De Leon, III, Austin, TX (US);

Marcus B. Grande, Pflugerville, TX (US);

Brian W. Hart, Austin, TX (US);

Vikramjit Sethi, Austin, TX (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0778 (2013.01); G06F 11/0721 (2013.01);
Abstract

Mechanisms are provided for generating a system dump data structure based on device state data. A system dump operation is initialized in a data processing system and a device dump is requested by a dump manager from a device coupled to the data processing system. A collection scope data structure and disruption vector corresponding to the device are retrieved. The collection scope data structure specifies a set of one or more functions in the device for which to collect state data. The disruption vector specifies, for each of the one or more functions, a corresponding level of disruption that will be caused by the device dump. The device dump data is collected from the device in accordance with the collection scope data structure and the disruption vector and the system dump data structure is generated based on the collected device dump data.


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