The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

May. 01, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Takashi Fukuhara, Higashikurume, JP;

Takuya Mukaibara, Susono-shi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 15/08 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G03G 15/0827 (2013.01); G01N 21/55 (2013.01);
Abstract

The reflection detection apparatus includes multiple light-receiving elements configured to detect a pattern formed on an object by receiving a reflected light from the object, and a selector configured to select a first light-receiving element group from the multiple light-receiving elements. The selector is configured to select the first light-receiving element group that includes one or more light-receiving elements each mainly receiving a specularly reflected light from an area of the object where no pattern is formed among the multiple light-receiving elements, on a basis of outputs from the multiple light-receiving elements. The detection of the pattern is made on a basis of an output from the first light-receiving element group.


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