The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

May. 02, 2014
Applicant:

Kenneth J Hintz, Fairfax Station, VA (US);

Inventor:

Kenneth J Hintz, Fairfax Station, VA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 23/00 (2006.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0016 (2013.01);
Abstract

An apparatus may detect an anomaly in a cavity in an object. The apparatus may comprise an array, a signal processor, and a threshold excedent determination processor. The array may receive an intensity reduced transmission beam of energy resulting from an irradiating beam of energy passing through an object having a cavity and a cavity wall. The cavity may be defined by the cavity wall. The array may have sensors. The signal processor may receive a measurement of the intensity reduced transmission beam; determine a thickness of the cavity wall; estimate an absorption rate of cavity wall; compute a predicted measurement employing the thickness and absorption rate; and calculate a cavity anomaly statistic for a cavity anomaly employing the predicted measurement and the measurement. The threshold excedent determination processor may generate a notification when the cavity anomaly statistic exceeds a threshold.


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