The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Oct. 09, 2012
Applicants:

Reeshidev Bansal, Spring, TX (US);

Michael P. Matheney, The Woodlands, TX (US);

Inventors:

Reeshidev Bansal, Spring, TX (US);

Michael P. Matheney, The Woodlands, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 49/00 (2006.01); G01V 1/30 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/30 (2013.01); E21B 49/00 (2013.01); G01V 1/303 (2013.01); G01V 1/362 (2013.01); G01V 2210/6222 (2013.01); G01V 2210/6226 (2013.01); G01V 2210/646 (2013.01);
Abstract

The present disclosure provides a system and method for inferring one or more physical property parameters of a subsurface media by inverting converted wave data acquired during a seismic survey. Composite seismic traces are generated at a plurality of survey azimuths (step). These composite traces are composed such that their amplitudes are free of effects of subsurface anisotropy. At least one of the generated composite seismic traces is then inverted by isotropic inversion to determine a property parameter of the subsurface media (step).


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