The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Dec. 21, 2011
Nicolas Dupuis, Chaudfontaine, BE;
Benoit Drooghaag, Ophain-Bois-Seigneur-Isaac, BE;
Nicolas Dupuis, Chaudfontaine, BE;
Benoit Drooghaag, Ophain-Bois-Seigneur-Isaac, BE;
Alcatel Lucent, Boulogne-Billancourt, FR;
Abstract
A process for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters, includes taking measurements of the first locally measurable loop characteristic for a plurality of loops, and obtaining a reference data set representing reference estimates of the loop feature value. The reference estimates are obtained by performing a calibrated second loop feature value estimation method using a second locally measurable loop characteristic and a second set of parameters. The method further includes determining calibrated parameters so as to minimize a deviation between the reference estimates and estimates obtained by applying the first estimation method to the measurements using the calibrated parameters as the first set of parameters.