The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
May. 01, 2015
The Florida State University Research Foundation, Inc., Tallahassee, FL (US);
Mohamadamin Salmani, Tallahassee, FL (US);
Chris S. Edrington, Tallahassee, FL (US);
The Florida State University Research Foundation, Inc., Tallahassee, FL (US);
Abstract
A novel method for real-time small-signal stability analysis for power electronic-based components in a power system. The method is based on impedance measurement techniques and Generalized Nyquist Criterion. The method is capable of real-time application. The method may be used to monitor a system in real-time by perturbing the system persistently and utilizing the system's responses to calculate source/load impedance in time-domain and based on d-q impedance measurement theory. Time-domain results may be transferred to frequency-domain results by taking advantage of a fast Fourier transform algorithm (or optionally discrete Fourier transformer for discrete systems) and monitoring the system's stability by obtaining a Nyquist contour and employing Generalized Nyquist Criterion or unit circle criterion.