The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Jun. 28, 2013
Applicant:
Keysight Technologies, Inc., Minneapolis, MN (US);
Inventors:
Michael T. McTigue, Colorado Springs, CO (US);
Kenneth W. Johnson, Colorado Springs, CO (US);
Edward Vernon Brush, IV, Colorado Springs, CO (US);
Assignee:
Keysight Technologies, Inc., Santa Rosa, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06788 (2013.01); G01R 1/06766 (2013.01); G01R 19/0023 (2013.01);
Abstract
A measurement probe comprises at least one input port configured to receive an input signal generated in relation to a device under test (DUT), and an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude.