The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Apr. 09, 2010
Zhihai Xiang, Beijing, CN;
Qiuhai LU, Beijing, CN;
Xiaowei Dai, Beijing, CN;
Yao Zhang, Beijing, CN;
Zhihai Xiang, Beijing, CN;
Qiuhai Lu, Beijing, CN;
Xiaowei Dai, Beijing, CN;
Yao Zhang, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
The present invention relates to a structural damage detection method for detecting damage of a structure. The method comprises scanning the surface of the structure with a tapper tapping with a tapping force at a predetermined frequency band while scanning; measuring the response signals transmitted from the surface of the structure; transforming the measured signals to acquire the signal spectrum at each position of the structure surface; intercepting from the signal spectrum a spectrum envelope; calculating a damage indicator at each position of the structure surface; and determining a position where the damage indicator changes abruptly as a position of structural damage. The present invention further relates to a structural damage detection system utilizing the structural damage detection method and a structural damage detection device for use therein.