The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Aug. 01, 2013
Erik A. Lombardo, Sharon, SC (US);
David S. Segletes, York, SC (US);
Timor Abu-jaber, Charlotte, NC (US);
Erik A. Lombardo, Sharon, SC (US);
David S. Segletes, York, SC (US);
Timor Abu-Jaber, Charlotte, NC (US);
Siemens Energy, Inc., Orlando, FL (US);
Abstract
A scanning probe for an industrial nondestructive evaluation (NDE) ultrasound or eddy current scanning system. The scanning probe gathers reflected waveform data indicative of internal characteristics of the test object. The scanning probe also includes a self-contained multi-axis position encoder that correlates both multi-dimensional probe underside translation and rotation motion across the test sample surface with the multi-dimensional spatial location on the test object surface. The position encoder compensates for probe rotation that would otherwise negatively impact probe position determination accuracy. A data acquisition system combines sets of positional and waveform data for processing by an NDE analyzer.