The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Aug. 13, 2014
Nikkato Corporation, Sakai-shi, Osaka, JP;
Tsubaki Nakashima Co., Ltd., Katsuragi-shi, Nara, JP;
Hiroshi Onishi, Sakai, JP;
Hiroshi Ikeda, Sakai, JP;
Hiroki Takimoto, Sakai, JP;
Hiroshi Uemura, Sakai, JP;
Kenji Yamada, Katsuragi, JP;
Hideki Ono, Katsuragi, JP;
Hiroyuki Matsuyama, Katsuragi, JP;
NIKKATO CORPORATION, Sakai-shi, JP;
TSUBAKI NAKASHIMA CO., LTD., Katsuragi-shi, JP;
Abstract
Provided are a sintered ceramic and a ceramic sphere which are inhibited from suffering surface peeling due to fatigue resulting from repetitions of loading and can attain an improvement in dimensional accuracy when subjected to surface processing and which have excellent wear resistance and durability. A ceramic-sphere inspection device is also provided with which a ceramic sphere is inspected for a flaw present in the surface layer and for snow flakes without destroying the ceramic sphere. The device is a ceramic-sphere inspection device () in which a ceramic sphere (S) is rotatably supported in a given position and illuminating light emitted from a light projector () is detected with a light receiver () to evaluate the state of the inner part of the surface layer, and has been configured so that the light receiver () does not detect the light emitted from the light projector () and reflected at the surface of the ceramic sphere.