The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Aug. 19, 2011
Applicant:

Marc Lévesque, St-Augustin-de-Desmaures, CA;

Inventor:

Marc Lévesque, St-Augustin-de-Desmaures, CA;

Assignee:

INDUSTRIES MACHINEX INC., Plessisville, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/90 (2006.01); G01B 11/24 (2006.01); G01N 21/88 (2006.01); B07C 5/342 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/88 (2013.01); B07C 5/342 (2013.01); G01N 21/55 (2013.01); G01N 21/90 (2013.01); G01B 11/24 (2013.01); G01N 2021/845 (2013.01); G05B 2219/37572 (2013.01); G05B 2219/45047 (2013.01);
Abstract

An apparatus and a method for inspecting matter and the use thereof for sorting recyclable material including transparent material are disclosed. The apparatus comprises a lighting unit for projecting a concentrated diffused lighting onto the matter to generate a specular reflected light beam representative of the inspected matter. The apparatus comprises an imaging unit mounted according to a given imaging angle with respect to the projected concentrated diffused lighting for imaging the specular reflected light beam to provide image data representative of the inspected matter. The apparatus comprises an analyzing unit for analyzing the image data and providing matter characterization data based on the specular reflected light beam representative of the inspected matter.


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