The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Mar. 12, 2013
Applicant:
Visualant, Inc., Seattle, WA (US);
Inventors:
Richard Ian Mander, Bainbridge Island, WA (US);
Thomas A. Furness, III, Seattle, WA (US);
Brian T. Schowengerdt, Seattle, WA (US);
Michael Vivian Denton, Christchurch, NZ;
Allan David Beach, Prebbleton, NZ;
Alan Charles Tompkins, Ferny Grove, AU;
Assignee:
Visualant, Inc., Seattle, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01N 21/27 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01N 21/31 (2013.01);
Abstract
Sampling device geometry reduces specular reflectance, using lenses to focus electromagnetic energy to predominately return scattered rather than reflected electromagnetic energy to detector(s), reducing effect of non-matte surfaces and/or window. Sampling device includes inherent automatic optical calibration, and optionally thermal calibration. Calibration detectors are optically isolated with respective emitters.