The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Aug. 29, 2011
Applicants:

Oliver Hayden, Herzogenaurach, DE;

Michael Johannes Helou, Regensburg, DE;

Sandro Francesco Tedde, Erlangen, DE;

Inventors:

Oliver Hayden, Herzogenaurach, DE;

Michael Johannes Helou, Regensburg, DE;

Sandro Francesco Tedde, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 15/10 (2006.01); G01N 27/72 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1031 (2013.01); G01N 27/72 (2013.01);
Abstract

The disclosure relates to flow cytometry. A method for precise individual cell detection and cell measurement of cells in the flow is disclosed. A pair of magnetoresistive components are used to produce a characteristic measuring signal profile from which the following information can be obtained: number of measurement deviations, measurement deviation distances, measurement deviation amplitudes, measurement deviation direction and measurement deviation direction sequence. The flow speed and the cell diameter can also be determined. Also, the signal noise ratio can be determined using the measurement deviation amplitude.


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