The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Jul. 11, 2012
Applicants:
G. Jeffrey Snyder, Pasadena, CA (US);
Shiho Iwanaga, Rancho Palos Verdes, CA (US);
Inventors:
G. Jeffrey Snyder, Pasadena, CA (US);
Shiho Iwanaga, Rancho Palos Verdes, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 7/00 (2006.01); G01K 7/02 (2006.01); G01N 25/72 (2006.01);
U.S. Cl.
CPC ...
G01K 7/02 (2013.01); G01N 25/72 (2013.01);
Abstract
A novel scanning Seebeck coefficient measurement technique is disclosed utilizing a cold scanning thermocouple probe tip on heated bulk and thin film samples. The system measures variations in the Seebeck coefficient within the samples. The apparatus may be used for two dimensional mapping of the Seebeck coefficient on the bulk and thin film samples. This technique can be utilized for detection of defective regions, as well as phase separations in the sub-mm range of various thermoelectric materials.