The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Feb. 21, 2014
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Dennis Robert Engelbrecht, Philomath, OR (US);

Cornelis Daniel Hoekstra, Corvalis, OR (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 17/02 (2006.01); H04N 5/367 (2011.01); H04N 5/357 (2011.01); H04N 5/365 (2011.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); H04N 5/357 (2013.01); H04N 5/365 (2013.01); H04N 5/3675 (2013.01);
Abstract

An imager with error verification capabilities may include an array of pixels and an array of error detection circuits. The array of pixels may receive control signals that control the array of pixels to produce image pixel signals. The error detection circuits may receive the control signals and produce error detection signals. The image pixels and error detection signals may be conveyed over a readout path to image processing circuitry such as an external digital signal processor for detecting control signal errors. Each error detection circuit may be a modified copy of a corresponding pixel in the pixel array or may be a read only memory element. The array of error detection circuits may produce unique values that may be compared to expected values to detect whether correct control signals are provided to the pixel array for a given mode of operation.


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