The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Mar. 12, 2014
Hiromitsu Miyagawa, Tokyo, JP;
Takahiro Fukase, Kanagawa, JP;
Hiromitsu Miyagawa, Tokyo, JP;
Takahiro Fukase, Kanagawa, JP;
RICOH COMPANY, LIMITED, Tokyo, JP;
Abstract
An image test apparatus acquires a result of determination on a defect in a read image obtained by reading an image formed and output on a recording medium, based on a difference between the read image and a test image, acquires a sheet type of a sheet from which the read image is read, calculates a stacked position of a sheet of a defective read image in which the defect is detected among sheets stacked on a discharge tray serving as a discharge destination of the sheet of the read image, on the discharge tray based on the result of the determination on the defect in the read image and based on the acquired sheet type, and controls an indicating unit, which indicates a height at predetermined intervals in a direction in which the sheets are stacked on the discharge tray, based on the calculated stacked position.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile