The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Sep. 22, 2006
Applicants:

Xiang Liu, Marlboro, NJ (US);

Xing Wei, Dublin, CA (US);

Inventors:

Xiang Liu, Marlboro, NJ (US);

Xing Wei, Dublin, CA (US);

Assignee:

Alcatel Lucent, Boulogne-Billancourt, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/60 (2013.01); H04B 10/516 (2013.01); H04B 10/67 (2013.01);
U.S. Cl.
CPC ...
H04B 10/60 (2013.01); H04B 10/5161 (2013.01); H04B 10/677 (2013.01);
Abstract

A digital version of both amplitude and phase of a received optical is developed by employing direct differential detection in conjunction with digital signal processing. The signal is split into three copies. An intensity profile is conventionally obtained using one of the copies. Phase information is obtained by supplying each remaining copy to a respective one of a pair of optical delay interferometers that have orthogonal phase offsets, followed by respective balanced intensity detectors. The output of each of the balanced intensity detectors, and the intensity profile, are each converted to respective digital representations. Signal processing is used to develop the phase information from the digital representations of the output of the balanced intensity detector outputs.


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