The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Jul. 15, 2014
Applicant:

Marvell World Trade Ltd., St. Michael, BB;

Inventors:

Qiyue Zou, San Jose, CA (US);

Michael Madden, Mountain View, CA (US);

Gregory Burd, San Jose, CA (US);

Assignee:

Marvell World Trade Ltd., St. Michael, BB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/455 (2006.01); G11B 5/58 (2006.01); G11B 5/012 (2006.01); G11B 5/596 (2006.01); G11B 5/48 (2006.01); G11B 20/10 (2006.01);
U.S. Cl.
CPC ...
G11B 5/455 (2013.01); G11B 5/012 (2013.01); G11B 5/58 (2013.01); G11B 5/59683 (2013.01); G11B 5/4886 (2013.01); G11B 5/59627 (2013.01); G11B 20/10 (2013.01);
Abstract

Systems and methods are provided for calibrating signals retrieved from a storage device using a first reader and a second reader. The systems and methods further include reading a first signal using the first reader and a second signal using the second reader. Control circuitry computes a calibration metric associated with the first reader and the second reader based on the combination of the first signal and the second signal. At least one of the first signal and the second signal is subsequently decoded based in part on the computed calibration metric.


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