The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Aug. 02, 2013
George Mason Research Foundation, Inc., Fairfax, VA (US);
The United States of America, As Represented BY the Secretary of the Navy, Arlington, VA (US);
Athanasios Iliopoulos, Bethesda, MD (US);
John G. Michopoulos, Washington, DC (US);
George Mason Research Foundation, Inc., Fairfax, VA (US);
The United States of America, as Represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A method and system for measuring and determining the full-field spatial distributions of strain tensor field components in a two or three-dimensional space, as a consequence of deformation under generalized loading conditions. One or more digital cameras may be used to acquire successive images of a deforming body with optically distinctive features on its surface. A method for determining the location of characteristic points of the surface features and another one for tracking these points as deformation occurs. Elongations between neighboring points on the vicinity of a location of interest are computed. The elongation between points is calculated even though discontinuities may exist between them. Strain tensor fields are directly calculated as a tensor approximation from these elongations without determining or using the displacement vector distributions.