The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Jan. 25, 2011
Satoshi Nakazawa, Tokyo, JP;
Shinichi Ando, Tokyo, JP;
Satoshi Nakazawa, Tokyo, JP;
Shinichi Ando, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A document analysis apparatus comprises: a feature expression acquisition unit acquiring a feature expression appearing during an attention period in an analysis object document collection; a document collection acquisition unit acquiring a feature expression containing document (FECD) collection in which a feature expression appears, from an analysis population including an analysis object document collection; a context determination unit specifying an analysis/FECD corresponding to an analysis object document among a FECD collection for every feature expression, and specifies a context in which the feature expression appeared in multiple analysis/FECDs; a context comparison determination unit specifying a non analysis/FECD not corresponding to an analysis object document among a FECD collection, and within that, compares a context in which the feature expression has appeared and a context specified previously; and a feature degree setting unit performing giving or the like of a feature degree to a feature expression from the comparison.