The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Sep. 14, 2012
Applicants:

Manish A. Bhide, New Delhi, IN (US);

Srinivas Kiran Mittapalli, Secunderabad, IN (US);

Sriram Padmanabhan, San Jose, CA (US);

Inventors:

Manish A. Bhide, New Delhi, IN (US);

Srinivas Kiran Mittapalli, Secunderabad, IN (US);

Sriram Padmanabhan, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30563 (2013.01);
Abstract

A computer-implemented method, computer program product and a system for identifying and handling slowly changing dimension (SCD) attributes for use with an Extract, Transform, Load (ETL) process, comprising importing a data model for dimensional data into a data integration system, where the dimensional data comprises a plurality of attributes, identifying via a data discovery analyzer one or more attributes in the data model as SCD attributes, importing the identified SCD attributes into the data integration system, selecting a data source comprising dimensional data, automatically generating an ETL job for the dimensional data utilizing the imported SCD attributes, and executing the automatically generated ETL to extract the dimensional data from the data source and loading the dimensional data into the imported SCD attributes in a target data system.


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