The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Dec. 29, 2012
Applicant:
Futurewei Technologies, Inc., Plano, TX (US);
Inventors:
Jason Yang Sun, Palo Alto, CA (US);
Qingqing Zhou, Santa Clara, CA (US);
Mohan Singamshetty, Sunnyvale, CA (US);
Assignee:
Futurewei Technologies, Inc., Plano, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30445 (2013.01); G06F 17/30483 (2013.01);
Abstract
Queries may be processed more efficiently in an massively parallel processing (MPP) database by locally optimizing the global execution plan. The global execution plan and a semantic tree may be provided to MPP data nodes by an MPP coordinator. The MPP data nodes may then use the global execution plan and the semantic tree to generate a local execution plan. Thereafter, the MPP data nodes may select either the global execution plan or the local execution plan is accordance with a cost evaluation.