The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Sep. 09, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Nathan M. Bodenstab, Melrose, MA (US);

Nobuyasu Itoh, Yokohama, JP;

Gakuto Kurata, Tokyo, JP;

Masafumi Nishimura, Yokohama, JP;

Paul J. Vozila, Arlington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01); G06F 17/20 (2006.01); G06F 17/21 (2006.01);
U.S. Cl.
CPC ...
G06F 17/27 (2013.01);
Abstract

Methods and a system for calculating N-gram probabilities in a language model. A method includes counting N-grams in each page of a plurality of pages or in each document of a plurality of documents to obtain respective N-gram counts therefor. The method further includes applying weights to the respective N-gram counts based on at least one of view counts and rankings to obtain weighted respective N-gram counts. The view counts and the rankings are determined with respect to the plurality of pages or the plurality of documents. The method also includes merging the weighted respective N-gram counts to obtain merged weighted respective N-gram counts for the plurality of pages or the plurality of documents. The method additionally includes calculating a respective probability for each of the N-grams based on the merged weighted respective N-gram counts.


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