The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Jun. 28, 2011
Jean Rinkel, Fontaine, FR;
Guillaume Beldjoudi, Grigny, FR;
Jean-marc Dinten, Lyons, FR;
Georges Gonon, Claix, FR;
Veronique Rebuffel, Corenc, FR;
Jean Rinkel, Fontaine, FR;
Guillaume Beldjoudi, Grigny, FR;
Jean-Marc Dinten, Lyons, FR;
Georges Gonon, Claix, FR;
Veronique Rebuffel, Corenc, FR;
Abstract
A calibration method for a device for identifying materials using X-rays, including: a) determining at least one calibration material and, for each calibration material, at least one calibration thickness of this material, b) measuring, for each of the calibration materials and for each of the selected calibration thicknesses, attenuation or transmission coefficients for X radiation, c) calculating statistical parameters from the coefficients, d) determining or calculating, for each calibration material and for each calibration thickness, a presence probability distribution law, as a function of the statistical parameters.