The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Dec. 31, 2013
Google Inc., Mountain View, CA (US);
Jungwoo Ha, Los Altos, CA (US);
Jaeheon Yi, San Francisco, CA (US);
Peter Dinges, Urbana, IL (US);
Jeremy Manson, Mountain View, CA (US);
Caitlin Harrison Sadowski, San Francisco, CA (US);
Na Meng, Austin, TX (US);
GOOGLE INC., Mountain View, CA (US);
Abstract
A system and method are disclosed for determining the root cause of non-deterministic tests. An exemplary system may receive a non-deterministic test and run the non-deterministic test with call trace collection enabled. For each trace, the system may determine whether the trace was associated with a passing or failing test. Each trace may be labeled according to the trace's association. Then, dynamic call trees may be constructed, one for the traces associated with passing tests and one for traces associated with failing tests. The dynamic call trees may be compared to determine subtree patterns that occur in one tree, but not the other. The subtree patterns may then be ranked based on the number of times the subtrees occur in the traces in order to determine the root cause of the non-deterministic test.