The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Sep. 12, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Marik Marshak, Newton, MA (US);

Alexandr Veprinsky, Brookline, MA (US);

Dan Aharoni, Brookline, MA (US);

Stephen F. Modica, Uxbridge, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 5/00 (2006.01); G06F 13/36 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3048 (2013.01); G06F 11/3089 (2013.01); G06F 11/3466 (2013.01);
Abstract

Described are techniques for processing I/O (input/output) operations. A first observed value of a first performance metric denoting any of a current workload or performance for a first physical device is determined. A target time delay for the first physical device is identified based on the first observed value of the first performance metric. The target time delay specifies a minimum time delay between consecutive host I/Os directed to the first physical device. The target time delay is enforced with respect to consecutive host I/Os directed to the first physical device.


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