The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Dec. 18, 2014
Microchip Technology Incorporated, Chandler, AZ (US);
Jerry Hanauer, Germantown, WI (US);
Todd O'Connor, Menomonee Falls, WI (US);
MICROCHIP TECHNOLOGY INCORPORATED, Chandler, AZ (US);
Abstract
Systems and methods for determining multiple touch events in a multi-touch sensor system are provided. The system may have a touch sensor including nodes defined by a plurality of electrodes, which may comprise a first and second set. The method may include measuring self capacitance for at least two electrodes, detecting a touched electrode, and measuring the mutual capacitance for only a subset of the nodes (e.g., fewer than all of the nodes and including at least the nodes corresponding to the touched electrodes) resulting in the detection of two or more touched nodes. The self capacitance measurements may be performed on each of the electrodes, and the touched electrodes may comprise electrodes from both the first and second sets. Alternatively, the self capacitance measurements may be performed only on electrodes in the first set, and the touched electrodes may comprise electrodes from only the first set.