The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Aug. 25, 2014
Keiji Kojima, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An image inspection apparatus includes a first-image obtaining unit, a scanned-image obtaining unit, a second-image obtaining unit, first and second registration units, a combining unit, and an inspection unit. The first-image obtaining unit obtains a first image generated by scanning a sheet on which a predetermined image has been printed. The scanned-image obtaining unit obtains a scanned image generated by scanning a printed matter produced by printing a second image additionally on the sheet. The second-image obtaining unit obtains the second image. The first registration unit performs registration between the first and scanned images. The second registration unit performs registration between the second image and the scanned image. The combining unit generates a master image by combining the first and second images based on registration results performed by the first and second registration units. The inspection unit inspects the printed matter by comparing the scanned image against the master image.