The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Mar. 20, 2013
Applicant:

Commissariat a L'energie Atomique, Paris, FR;

Inventors:

Alexandre Chibane, Grenoble, FR;

Pierre Grangeat, Saint Ismier, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/416 (2006.01); G01R 31/12 (2006.01);
U.S. Cl.
CPC ...
G01R 31/1227 (2013.01); G01N 27/4163 (2013.01);
Abstract

The method for detecting defective electrodes in an electrode matrix comprises measurement of an electrochemical impedance spectrum for each of the electrodes. Modeling of the spectrum impedance relative to each electrode by means of an implicit non-integral frequency model is performed in the form of a parameter matrix. Principal components analysis of the matrix is performed to transform said parameter matrix into a final matrix containing decorrelated variables representing the parameter matrix in a new space. The distance between each electrode and a reference point is calculated. These calculated distances are compared with a preset threshold distance and the electrodes having a distance greater than the threshold distance are classified as being defective.


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