The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Apr. 11, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Se Do Gwon, Goyang-si, KR;

Kyu Tae Kang, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 21/84 (2006.01); G01N 21/00 (2006.01); G05D 3/12 (2006.01); G05D 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00584 (2013.01); G01N 21/8483 (2013.01); G05D 3/125 (2013.01); Y10T 436/115831 (2015.01); Y10T 436/12 (2015.01);
Abstract

A test apparatus, which may compare detection data of a detector with reference data and correct a positional error in the detector due to the failing of a motor, and a method of controlling the same are provided. The test apparatus includes a detector configured to irradiate light to a plurality of chambers of a reaction device and detect a detection target, a motor configured to move the detector such that light is irradiated to the plurality of chambers, and a controller configured to compare detection data of the detector regarding the reaction device with reference data, determine a positional error in the detector, and correct the positional error.


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