The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Nov. 16, 2011
Applicants:

Tatsuya Sawasaki, Matsuyama, JP;

Yaeta Endo, Matsuyama, JP;

Tomoaki Ishigami, Yokohama, JP;

Ichiro Aoki, Yokohama, JP;

Inventors:

Tatsuya Sawasaki, Matsuyama, JP;

Yaeta Endo, Matsuyama, JP;

Tomoaki Ishigami, Yokohama, JP;

Ichiro Aoki, Yokohama, JP;

Assignees:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); G01N 33/564 (2006.01); G01N 33/68 (2006.01);
U.S. Cl.
CPC ...
G01N 33/6869 (2013.01); G01N 33/564 (2013.01); G01N 33/6845 (2013.01); G01N 2800/323 (2013.01);
Abstract

Provided are a detection method for a myriad of proteins involved in an autoimmune disease with high sensitivity and high efficiency, and an analysis method for data resulting from the detection method. In order to construct the detection method and analysis method, there is provided means for comprehensively analyzing the proteins involved in an autoimmune disease by bringing a mammal-derived protein expressed in a cell-free protein synthesis system into contact with a sample derived from a patient with an autoimmune disease to detect autoantibody production, and subjecting the detected data to statistical analysis processing, and further, gene ontology analysis and/or pathway analysis.


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