The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

May. 22, 2013
Applicant:

Gwangju Institute of Science and Technology, Buk-gu, Gwangju, KR;

Inventors:

Kyi Hwan Park, Gwangju, KR;

Dong Kyu Kim, Gwangju, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01H 9/00 (2006.01);
U.S. Cl.
CPC ...
G01N 29/2418 (2013.01); G01H 9/00 (2013.01);
Abstract

Disclosed herein are a system and method for three-dimensional vibration measurement. The method includes measuring vibration components and shape information at a vibration measurement point of a measurement target by sequentially emitting laser beams to the vibration measurement point of the measurement target at each of three measuring positions for measuring vibration of the measurement target; obtaining transformation matrices between first to third coordinate systems with respect to each of the measuring positions and a local coordinate system with respect to the vibration measurement point of the measurement target, based on the shape information; measuring angles between unit vectors of respective axes of the local coordinate system and direction vectors of the laser beams emitted with reference to the first to third coordinate systems upon measuring the vibration components; and measuring three-dimensional vibration of the measurement target based on the vibration components and the angles.


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