The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Dec. 06, 2013
Applicant:

Shiseido Company, Ltd., Tokyo, JP;

Inventors:

Naoto Hanyu, Kanagawa, JP;

Eiichi Negishi, Kyoto, JP;

Kazuhiko Mibayashi, Kyoto, JP;

Takafumi Sumiyama, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); G01N 21/33 (2006.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 21/33 (2013.01); G01N 21/59 (2013.01);
Abstract

An evaluation method for evaluating an ultraviolet radiation protection effect in a measurement sample applied on an application member includes the first step of switching to a first filter for measuring a spectral transmittance before photodeterioration by emission of light from a light source, and measuring the spectral transmittance, the second step of switching to a second filter for ultraviolet irradiation and causing the photodeterioration by the emission of the light after the measurement by the first step, and thereafter, switching to the first filter and measuring the spectral transmittance, and the third step of evaluating the ultraviolet radiation protection effect based on a change over time in the spectral transmittance obtained by the second step. Each of the first and second filters includes multiple light source filters. The first filter includes ND filters switchable in accordance with the light amount of the light source in the light source filters.


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