The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
May. 29, 2014
Applicant:
Vuva Analytics, Inc., Lakeway, TX (US);
Inventors:
Phillip Walsh, Austin, TX (US);
Anthony T. Hayes, Leander, TX (US);
Dale A. Harrison, Austin, TX (US);
Assignee:
VUV Analytics, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01N 21/25 (2006.01); G01N 21/19 (2006.01); G01N 21/33 (2006.01);
U.S. Cl.
CPC ...
G01N 21/255 (2013.01); G01N 21/19 (2013.01); G01N 21/33 (2013.01); G01N 2021/335 (2013.01);
Abstract
A highly efficient vacuum ultraviolet circular dichroism spectrometer is provided; the spectrometer suitable for laboratory use or for integration into a beam line at a synchrotron radiation facility. In one embodiment, a spectroscopic circular dichroism instrument is provided; the instrument configured so as to enable circular dichroism data to be simultaneously obtained for multiple wavelengths of light. The instrument may be further configured to operate in at least a portion of the vacuum ultraviolet wavelength region.