The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Dec. 28, 2012
Applicant:

Bridgestone Corporation, Tokyo, JP;

Inventor:

Tetsuya Sukegawa, Kodaira, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/02 (2006.01); G01N 21/95 (2006.01); G01N 21/952 (2006.01); G01B 11/24 (2006.01); G01N 21/25 (2006.01); G01N 21/57 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01M 17/027 (2013.01); G01B 11/24 (2013.01); G01B 11/25 (2013.01); G01B 11/2509 (2013.01); G01N 21/255 (2013.01); G01N 21/57 (2013.01); G01N 21/952 (2013.01); G01N 21/9515 (2013.01);
Abstract

An appearance inspection apparatus and an appearance inspection method for detecting a shape, surface unevenness, shine or changes in tone on the surface. The method includes steps of acquiring reflected luminance data on the sample surface by casting a slit light having an intermediate wavelength of three types of lights having different wavelengths, receiving reflected light of the slit light, acquiring surface data by casting two lights of different wavelengths other than the intermediate wavelength at a position other than the position illuminated by the slit light on the sample surface from two different directions so as to overlap two lights with each other and receiving reflected light, detecting surface unevenness from a ratio between the intensities of lights, changes in tone by combining reflected luminance data and surface data, gloss on the sample surface based on the presence or absence of surface unevenness and the changes in color tone.


Find Patent Forward Citations

Sukegawa, Tetsuya. (2016). Appearance inspection apparatus and appearance inspection method with uneveness detecting (U.S. Patent No. 9310278). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9310278

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