The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

May. 04, 2015
Applicant:

Nidek Co., Ltd., Gamagori-shi, Aichi, JP;

Inventor:

Hitoshi Abe, Okazaki, JP;

Assignee:

NIDEK CO., LTD., Gamagori, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 18/18 (2006.01); A61F 9/008 (2006.01); A61B 18/00 (2006.01); A61B 18/20 (2006.01);
U.S. Cl.
CPC ...
A61F 9/00821 (2013.01); A61B 2018/00589 (2013.01); A61B 2018/00988 (2013.01); A61B 2018/2085 (2013.01); A61F 2009/00863 (2013.01); A61F 2009/00897 (2013.01);
Abstract

An ophthalmic laser treatment apparatus for treating an eye including: an irradiation unit including a laser source, and a scanner for scanning an irradiation spot from the laser source onto a tissue of the eye in two dimensions; a memory for storing a plurality of predetermined irradiation patterns in each of which a plurality of the irradiation spots are arranged in a predetermined arrangement; an irradiation pattern selecting unit including a switch for inputting a signal to select a pattern from the patterns stored in the memory; an pattern changing unit including a switch for inputting a signal to change part of the arrangement of the irradiation pattern in which irradiation spots are arranged on the basis of the selected irradiation pattern; and a control unit for controlling driving of the irradiation unit to sequentially irradiate the beam based on the irradiation pattern changed by the pattern changing unit.


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