The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2016
Filed:
Mar. 05, 2014
Qualcomm Incorporated, San Diego, CA (US);
Ozgur Dural, San Diego, CA (US);
Kaushik Chakraborty, San Diego, CA (US);
Soumya Das, San Diego, CA (US);
Bongyong Song, San Diego, CA (US);
Samir Salib Soliman, Poway, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
An apparatus for wireless communication obtains a first metric of a cell based on signals received by a WWAN radio tuned to a common frequency, and a second metric of the cell based on signals received by a WLAN radio tuned to the common frequency. The apparatus determines a calibration factor based on the first and second metrics, and performs cell search and cell measurement based on the calibration factor and signals received by the WLAN radio tuned to a target frequency. The common frequency may be a serving frequency of the WWAN, in which case the first and second metrics are one of frequency or power metrics and the calibration factor is one of a frequency offset and a power offset. The common frequency may also be a target frequency for inter-frequency measurements of the WWAN, in which case the calibration factor is based primarily on power measurements.