The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Nov. 16, 2012
Applicant:

Sprint Spectrum Lp, Overland Park, KS (US);

Inventors:

Daniel Vivanco, Sterling, VA (US);

Yu Zhou, Herndon, VA (US);

Chunmei Liu, Great Falls, VA (US);

Kyounghwan Lee, Herndon, VA (US);

Assignee:

Sprint Spectrum L.P., Overland Park, KS (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/54 (2013.01); H04L 12/801 (2013.01);
U.S. Cl.
CPC ...
H04L 12/569 (2013.01); H04L 47/10 (2013.01);
Abstract

A first throughput is determined of a first data flow at a gateway from a first access node and a second throughput is determined of second data flow at an inspection node from the gateway. A third throughput is determined comprising one or more third data flows from the gateway to a second access node based on a difference between the first throughput and the second throughput. At least one of the third data flows of the third throughput is identified, and when the third throughput meets a throughput threshold the identified third data flow is adjusted.


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