The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Nov. 18, 2014
Applicant:

SK Hynix Memory Solutions Inc., San Jose, CA (US);

Inventors:

Xiangyu Tang, San Jose, CA (US);

Lingqi Zeng, San Jose, CA (US);

Jason Bellorado, San Jose, CA (US);

Frederick K. H. Lee, Mountain View, CA (US);

Arunkumar Subramanian, San Jose, CA (US);

Assignee:

SK hynix memory solutions inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01);
Abstract

A read is performed using a first iteration of a read threshold voltage that is set to a default voltage to obtain a first characteristic. A second iteration of the read threshold voltage is generated using the default voltage and an offset. A read is performed using the second iteration of the read threshold voltage to obtain a second characteristic. A third iteration of the read threshold voltage is generated using the first and second characteristics. A read is performed using the third iteration of the read threshold voltage to obtain a third characteristic. It is determined if the third characteristic is one of the two characteristics closest to a stored characteristic. If so, a fourth iteration of the read threshold voltage is generated using the two closest characteristics.


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